| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 11 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Audio-visual technology | |
| #3 | Semiconductors | |
| #4 | Telecommunications | |
| #5 | Transport |
| # | Technology | |
|---|---|---|
| #1 | Analysing materials | |
| #2 | Semiconductor devices | |
| #3 | Television | |
| #4 | Wireless communication networks | |
| #5 | Vehicle servicing |
| # | Name | Total Patents |
|---|---|---|
| #1 | Nakano Hiroyuki | 11 |
| #2 | Maeda Shunji | 5 |
| #3 | Uto Sachio | 5 |
| #4 | Hamamatsu Akira | 5 |
| #5 | Nakata Toshihiko | 4 |
| #6 | Urano Yuta | 4 |
| #7 | Oshima Yoshimasa | 2 |
| #8 | Nishiyama Hidetoshi | 2 |
| #9 | Noguchi Minori | 1 |
| #10 | Yoshitake Yasuhiro | 1 |
| Publication | Filing date | Title |
|---|---|---|
| US2008068593A1 | Method and apparatus for detecting defects |