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NAEILHAE CO LTD

Overview
  • Total Patents
    49
  • GoodIP Patent Rank
    30,522
  • Filing trend
    ⇧ 100.0%
About

NAEILHAE CO LTD has a total of 49 patent applications. It increased the IP activity by 100.0%. Its first patent ever was published in 2016. It filed its patents most often in Republic of Korea, United States and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets optics, measurement and computer technology are BROOKER GARY, LYNCEE TEC S A and HORIMAI HIDEYOSHI.

Patent filings in countries

World map showing NAEILHAE CO LTDs patent filings in countries

Patent filings per year

Chart showing NAEILHAE CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Kim Byung Mok 49
#2 Sung Mal Eum 49
#3 Lee Sang Jin 49
#4 Kim Ji Hoon 26
#5 Park Seong Jin 23

Latest patents

Publication Filing date Title
KR20210023959A An Improved Holographic Reconstruction Apparatus and Method
KR20210018402A Inspection system for depositing one or more layers on a substrate supported by a carrier using holographic reconstruction
KR20210005975A Substrate inspection apparatus including scanning function
KR20210005976A Substrate inspection apparatus
KR20200143335A A method to judge process defects using reconsructed hologram
KR20200144083A Inspection system for depositing one or more layers on a substrate supported by a carrier using holographic reconstruction
KR20200139122A A method of generating three-dimensional shape information of an object to be measured
KR20200127958A Apparatus for generating three-dimensional shape information of an object to be measured
KR20200110631A Method for generating 3d shape information of an object
KR20200042445A Apparatus for generating three-dimensional shape information of an object to be measured
KR20200034681A A method of generating three-dimensional shape information of an object to be measured
KR20200030025A A method of generating three-dimensional shape information of an object to be measured
KR20200040209A Apparatus for generating three-dimensional shape information of an object to be measured
KR20190137733A Apparatus and Method For Detecting Defects
KR20190082171A An Improved Holographic Reconstruction Apparatus and Method
KR20200072306A Method for generating 3d shape information of an object
KR20200072309A Inspection system for depositing one or more layers on a substrate supported by a carrier using holographic reconstruction
KR20200071372A Apparatus for generating three-dimensional shape information of an object to be measured
KR20200070830A A method of generating three-dimensional shape information of an object to be measured
KR20200048719A Substrate inspection apparatus