MIKOSHIBA NOBUO innovation strategy

Patent filings in countries

#	Industry
#1	Semiconductors
#2	Basic communication technologies
#3	Telecommunications
#4	Thermal processes
#5	Surface technology and coating
#6	Electrical machinery and energy
#7	Measurement

#	Technology
#1	Semiconductor devices
#2	Resonators
#3	Transmission
#4	Heat-exchanger without contact
#5	Heat-exchange device details
#6	Coating metallic material
#7	Analysing materials
#8	Electric discharge tubes

Publication	Filing date	Title
US5272721A	1992-10-14	Spread spectrum receiving device
GB9204143D0	1992-02-26	Spread-spectrum communication apparatus
GB9117667D0	1991-08-15	Cooling semiconductor devices
GB9117666D0	1991-08-15	Cooling semiconductor devices
DE4033141A1	1990-10-18	Construction of MOS integrated circuit for use at low temperature - has depletion transistors with gate-electrode which has low work function and enhancement devices using high work function material
GB9021721D0	1990-10-05	Integrated circuit
US5245207A	1990-08-17	Integrated circuit
EP0460305A1	1990-06-04	Method for observing microscopic surface structure
CA2014296A1	1990-04-10	Integrated circuit
JPH03257953A	1990-03-08	Semiconductor device
JPH03236643A	1990-02-14	Spread spectrum communication equipment
GB8918867D0	1989-08-18	Cooling semiconductor devices
JPH02250534A	1989-03-24	Spread spectrum communication equipment
JPH02222134A	1989-02-23	Thin film forming apparatus
JPH02216040A	1989-02-16	Reflected electron beam diffraction apparatus
JPH02216748A	1989-02-16	Sample surface unevenness observation method by reflection electron beam diffraction
JPH02216041A	1989-02-16	Reflected electron beam diffraction apparatus
JPH02216042A	1989-02-16	Reflected electron beam diffraction apparatus
JPH0258255A	1988-08-23	Semiconductor chip
JPH0258254A	1988-08-23	Semiconductor element