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MICROWAVE CHARACTERIZATION CT

Overview
  • Total Patents
    12
  • GoodIP Patent Rank
    213,168
About

MICROWAVE CHARACTERIZATION CT has a total of 12 patent applications. Its first patent ever was published in 2009. It filed its patents most often in France, WIPO (World Intellectual Property Organization) and Brazil. Its main competitors in its focus markets measurement and audio-visual technology are OBE TERAHERTZ TECH BEIJING CO LTD, UTILIS ISRAEL LTD and GUSTAVSEN ARVE.

Patent filings per year

Chart showing MICROWAVE CHARACTERIZATION CTs patent filings per year from 1900 to 2020

Focus industries

Focus technologies

Top inventors

# Name Total Patents
#1 Thouvenin Nicolas 10
#2 Vellas Nicolas 10
#3 Gaquiere Christophe 9
#4 Werquin Matthieu 8
#5 Vandenbrouck Simon 5
#6 Clemence Florent 4
#7 Jonniau Sylvain 3
#8 Bue-Erkmen Frederic 3
#9 Frederic Bue-Erkmen 1
#10 Simon Vandenbrouck 1

Latest patents

Publication Filing date Title
FR3007145A1 PORTABLE HYPERFREQUENCY IMAGING DEVICE, SYSTEM COMPRISING SUCH A DEVICE, AND CORRESPONDING IMAGING METHOD
FR2945121A1 PORTABLE RADIOMETRIC IMAGING DEVICE AND CORRESPONDING IMAGING METHOD