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MICROWAVE CHARACTERIZATION CENTER

Overview
  • Total Patents
    14
  • GoodIP Patent Rank
    124,372
  • Filing trend
    ⇩ 50.0%
About

MICROWAVE CHARACTERIZATION CENTER has a total of 14 patent applications. It decreased the IP activity by 50.0%. Its first patent ever was published in 2014. It filed its patents most often in France, EPO (European Patent Office) and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets measurement, telecommunications and basic communication technologies are ALGEMENE NL RADIO UNIE N V, TERMA AS and TAIYO MUSEN CO LTD.

Patent filings per year

Chart showing MICROWAVE CHARACTERIZATION CENTERs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Thouvenin Nicolas 11
#2 Vellas Nicolas 11
#3 Clemence Florent 9
#4 Jonniau Sylvain 8
#5 Werquin Matthieu 8
#6 Gaquiere Christophe 4
#7 Nicolas Thouvenin 2
#8 Sylvain Jonniau 2
#9 Florent Clemence 2
#10 Matthieu Werquin 2

Latest patents

Publication Filing date Title
FR3054674A1 HYPERFREQUENCY RADIOMETRIC IMAGING SYSTEM AND IMAGING METHOD THEREOF
FR3034527A1 IMAGING DEVICE AND CORRESPONDING IMAGING METHOD
FR3019426A1 IMAGING DEVICE AND CORRESPONDING IMAGING METHOD