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MICRO EPSILON OPTRONIC GMBH

Overview
  • Total Patents
    34
  • GoodIP Patent Rank
    141,249
  • Filing trend
    ⇩ 100.0%
About

MICRO EPSILON OPTRONIC GMBH has a total of 34 patent applications. It decreased the IP activity by 100.0%. Its first patent ever was published in 2006. It filed its patents most often in Germany, WIPO (World Intellectual Property Organization) and EPO (European Patent Office). Its main competitors in its focus markets measurement are OMRON ELECTRONICS MFG OF GERMA, USHIKATA SHOKAI KK and MORANDER KARL ERIK.

Patent filings per year

Chart showing MICRO EPSILON OPTRONIC GMBHs patent filings per year from 1900 to 2020

Focus industries

# Industry
#1 Measurement

Top inventors

# Name Total Patents
#1 Stautmeister Torsten 13
#2 Otto Tobias 10
#3 Schitter Georg 6
#4 Yoo Han Woong 3
#5 Wisspeintner Thomas 3
#6 Tobeschat Lars 3
#7 Unger Severin 3
#8 Schlarp Johannes 3
#9 Thier Markus 3
#10 Paris Rene 3

Latest patents

Publication Filing date Title
DE102019204613A1 Measuring system for optical measurement
DE102019200664B3 Sensor arrangement and method for measuring a measurement object
CN109313082A The method before bending wave and equipment are measured for using at least one Wavefront sensor
DE102015200034A1 Spectrometer
DE102011112529A1 Optical measuring system for determining distances
CN102687036A Sensor and method for optically measuring a distance, a position, and/or a profile
DE102010006011A1 Device and method for non-contact measurement of a distance and / or a profile
WO2010025712A1 Method for evaluation of measured values from an optical distance sensor
EP1901031A2 Measuring assembly and method for measuring a three-dimensionally extended structure
EP1901030A2 Measuring assembly and method for recording the surface of objects
DE102007007194A1 Measuring arrangement for measuring three-dimensional extended structure e.g. vehicle door gap, has mirror arrangement with multiple mirrors reuniting diverging regions such that reflective regions are intersected in measuring field
DE102007007192A1 Measuring arrangement for detecting surface of e.g. pipe, has mirror arrangement with mirrors that are arranged such that part of measuring area is guided to surface of object to be detected through mirrors
DE102006036166A1 Apparatus and method for measuring the distance of an object