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METRONOM AG

Overview
  • Total Patents
    15
About

METRONOM AG has a total of 15 patent applications. Its first patent ever was published in 2000. It filed its patents most often in EPO (European Patent Office), Germany and United States. Its main competitors in its focus markets measurement are NEUGÄRTNER MARIO, JIANGMEN LITAI TECH CO LTD and NAKAI HATSUO.

Patent filings per year

Chart showing METRONOM AGs patent filings per year from 1900 to 2020

Focus industries

# Industry
#1 Measurement

Top inventors

# Name Total Patents
#1 Nabs David 5
#2 Heimer Dietmar 5
#3 Blondeau Jean Dr 3
#4 Blondeau Jean 3
#5 Bruening Thomas 2
#6 Dietmar Heimer 1

Latest patents

Publication Filing date Title
DE102007003253A1 Measuring adapter for determining spatial position of point of component by optical measurement of spatial position of two measuring points, has solid bar element with coupling element
WO2007009754A1 Extension body with alignable target marker for referencing an inaccessible measurement point
EP1746383A1 Coupling bar with adjustable target for referencing an inaccessible measuring point
EP1677072A1 Unique and strainless test bodies
EP1541959A1 Apparatus and method for determining position coordinates
EP1538420A1 Variable test body and fixing device for variable test bodies
EP1510779A1 Method for determining position coordinates
EP1338863A1 Thermally compensated test body for coordinate measuring machines
DE10017463A1 Method and device for measuring objects
DE10015153A1 Light section system for ultraviolet light
DE10006663A1 Method for measuring long-wave surface structures