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MECC CO LTD

Overview
  • Total Patents
    42
  • GoodIP Patent Rank
    128,412
  • Filing trend
    ⇩ 33.0%
About

MECC CO LTD has a total of 42 patent applications. It decreased the IP activity by 33.0%. Its first patent ever was published in 2002. It filed its patents most often in Japan and Taiwan. Its main competitors in its focus markets optics and measurement are OPTUN BVI LTD, TAESAN LCD CO LTD and COVEYTECH LLC.

Patent filings in countries

World map showing MECC CO LTDs patent filings in countries
# Country Total Patents
#1 Japan 41
#2 Taiwan 1

Patent filings per year

Chart showing MECC CO LTDs patent filings per year from 1900 to 2020

Focus industries

# Industry
#1 Optics
#2 Measurement

Focus technologies

Top inventors

# Name Total Patents
#1 Fuse Masaki 11
#2 Inai Ryuji 11
#3 Kotaki Masaya 7
#4 Egashira Koji 4
#5 Narahara Sumuto 3
#6 Kojima Mitsuru 2
#7 Takahashi Tetsuo 2
#8 Egashira Mikio 2
#9 Yanagihara Toshio 2
#10 Hara Tomoyuki 2

Latest patents

Publication Filing date Title
JP2019191103A Defect inspection device
JP2019144073A Test chart and defect inspection device
JP2019113477A Defect inspection equipment and defect inspection method
JP2019049413A Defect inspection device and defect inspection method
JP2018185172A Angle adjustment device for line sensor, defect inspection device, and angle adjustment method for line sensor
JP2018054525A Defect inspection device and defect inspection method
JP2017210784A Guard post
JP2017002425A Spinneret for manufacturing nanofiber and electrostatic spinning apparatus equipped with the same
JP2016223975A Defect inspection device and defect inspection method
JP2016217989A Defect inspection device and defect inspection method
JP2016200496A Defect inspection device and defect inspection method
JP2016080462A Defect checkup apparatus
JP2016017839A Defect inspection device and defect inspection method
JP2015064224A Defect inspection system and marking method
JP2015059804A Defect inspection system, and marking method
JP2014177728A Nanofiber production apparatus
JP2014169977A Defect inspection apparatus, defect inspection method and lighting device
JP2014145660A Defect inspection device and defect inspection method
JP2014106141A Defect inspection device and defect inspection method
JP2013167483A Defect inspection system and defect inspection method