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MANDELIS ANDREAS

Overview
  • Total Patents
    25
  • GoodIP Patent Rank
    237,050
About

MANDELIS ANDREAS has a total of 25 patent applications. Its first patent ever was published in 1994. It filed its patents most often in United States, Canada and United Kingdom. Its main competitors in its focus markets medical technology, measurement and audio-visual technology are NON INVASIVE TECHNOLOGY INC, FUTREX INC and DELFIN TECHNOLOGIES LTD.

Patent filings per year

Chart showing MANDELIS ANDREASs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Mandelis Andreas 23
#2 Abrams Stephen 11
#3 Kulkarni Kiran 9
#4 Jeon Jin-Seok 8
#5 Matvienko Anna 7
#6 Telenkov Sergey 4
#7 Garcia Jose A 3
#8 Batista Jerias Alves 2
#9 Mativenko Anna 2
#10 Nicolaides Lena 2

Latest patents

Publication Filing date Title
US2016109393A1 Systems and methods for performing truncated-correlation photothermal coherence tomography
US2013278749A1 Method and apparatus for performing heterodyne lock-in imaging and quantitative non-contact measurements of electrical properties
US2013102865A1 Systems and methods for frequency-domain photoacoustic phased array imaging
US2014085449A1 Systems and methods for thermophotonic dynamic imaging
US2011118571A1 Method of performing wavelength modulated differential laser photothermal radiometry with high sensitivity
CN101262822A Method and apparatus using infrared photothermal radiometry (PTR) and modulated laser luminescence (LUM) for diagnostics of defects in teeth
US2007213607A1 Non-invasive biothermophotonic sensor for blood glucose monitoring
US2005234319A1 Laser photo-thermo-acoustic (PTA) frequency swept heterodyned lock-in depth profilometry imaging system
WO2005017996A1 Method of photocarrier radiometry of semiconductors
CA2314691A1 Method and apparatus for detection of defects in teeth
CA2305477A1 Non-contact photothermal radiometric metrologies and instrumentation for characterization of semiconductor wafers, devices and non electronic materials
GB9613326D0 Laser photothermal reconstruction for thermal diffusivity profiles in solids
CA2126481A1 Non-contact photothermal method for measuring thermal diffusivity and electronic defect properties of solids
GB9401187D0 Method for obtaining thermal diffusivity depth profiles in solids