| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 13 |
| # | Industry | |
|---|---|---|
| #1 | Computer technology | |
| #2 | Control | |
| #3 | Measurement | |
| #4 | IT methods for management | |
| #5 | Semiconductors |
| # | Name | Total Patents |
|---|---|---|
| #1 | Maeda Shunji | 13 |
| #2 | Shibuya Hisae | 8 |
| #3 | Sakai Kaoru | 3 |
| #4 | Takagi Yuji | 2 |
| #5 | Oka Kenji | 2 |
| #6 | Yoshida Atsushi | 2 |
| #7 | Magara Hiroyuki | 2 |
| #8 | Shishido Chie | 2 |
| #9 | Yoshida Minoru | 2 |
| #10 | Shibata Yukihiro | 2 |
| Publication | Filing date | Title |
|---|---|---|
| US2007177787A1 | Fault inspection method |