| # | Country | Total Patents | |
|---|---|---|---|
| #1 | China | 3 | |
| #2 | EPO (European Patent Office) | 3 | |
| #3 | Japan | 3 | |
| #4 | Republic of Korea | 3 | |
| #5 | United States | 3 | |
| #6 | WIPO (World Intellectual Property Organization) | 3 | |
| #7 | Israel | 2 | |
| #8 | Singapore | 2 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Optics | |
| #3 | Electrical machinery and energy |
| # | Technology | |
|---|---|---|
| #1 | Analysing materials | |
| #2 | Optical systems | |
| #3 | Measuring length, angles and areas | |
| #4 | Lighting device details |
| # | Name | Total Patents |
|---|---|---|
| #1 | Masumura Shigeki | 20 |
| Publication | Filing date | Title |
|---|---|---|
| JP2019100930A | Inspection system and inspection method | |
| JP2017062120A | Inspection illumination apparatus and inspection system | |
| JP2016180621A | Lighting device for inspection, and inspection system |