| # | Country | Total Patents | |
|---|---|---|---|
| #1 | WIPO (World Intellectual Property Organization) | 13 | |
| #2 | China | 9 | |
| #3 | Republic of Korea | 7 | |
| #4 | Australia | 5 | |
| #5 | EPO (European Patent Office) | 3 | |
| #6 | United States | 3 |
| # | Industry | |
|---|---|---|
| #1 | Textiles and paper | |
| #2 | Audio-visual technology | |
| #3 | Semiconductors | |
| #4 | Machines | |
| #5 | Machine tools | |
| #6 | Surface technology and coating |
| # | Name | Total Patents |
|---|---|---|
| #1 | Albertalli David | 32 |
| #2 | Edwards Charles O | 27 |
| #3 | Parks Paul A | 5 |
| #4 | Gratchev Oleg N | 4 |
| #5 | Boehm Robert G Jr | 4 |
| #6 | West Perry | 4 |
| #7 | Taff Robert D | 4 |
| #8 | Middleton James A | 4 |
| #9 | Patterson Roy M | 3 |
| #10 | David Albertalli | 3 |
| Publication | Filing date | Title |
|---|---|---|
| KR20080002968A | Printhead maintenance station | |
| KR20080005275A | Printable substrate and nozzle alignment system | |
| KR20050122195A | Industrial microdeposition system including masking to reduce the impact of droplet alignment and droplet volume tolerances and errors | |
| AU2002360448A8 | Microdeposition system | |
| US7160105B2 | Temperature controlled vacuum chuck | |
| US7244310B2 | Over-clocking in a microdeposition control system to improve resolution |