LEYBOLD HERAEUS INFICON has a total of 14 patent applications. Its first patent ever was published in 1976. It filed its patents most often in United States, Switzerland and Germany. Its main competitors in its focus markets measurement, surface technology and coating and electrical machinery and energy are SULZER METAPLAS GMBH, OERLIKON TRADING AG and SENTECH INSTR GMBH.
# | Country | Total Patents | |
---|---|---|---|
#1 | United States | 9 | |
#2 | Switzerland | 1 | |
#3 | Germany | 1 | |
#4 | France | 1 | |
#5 | United Kingdom | 1 | |
#6 | Italy | 1 |
# | Industry | |
---|---|---|
#1 | Measurement | |
#2 | Surface technology and coating | |
#3 | Electrical machinery and energy | |
#4 | Machines | |
#5 | Control | |
#6 | Mechanical elements |
# | Name | Total Patents |
---|---|---|
#1 | Morgan Michael J | 3 |
#2 | Lu Chih-Shun | 2 |
#3 | Schlereth Fritz H | 2 |
#4 | Lu Chih-Shum | 1 |
#5 | Lanpher Gary E | 1 |
#6 | Arnon Oded | 1 |
#7 | Gogol Carl A | 1 |
#8 | Gogol Jr Carl A | 1 |
#9 | Chou Tzeyang J | 1 |
#10 | Prince Eric T | 1 |
Publication | Filing date | Title |
---|---|---|
US4692630A | Wavelength specific detection system for measuring the partial pressure of a gas excited by an electron beam | |
US4672203A | Two stage valve for use in pressure converter | |
US4381894A | Deposition monitor and control system | |
US4335961A | Refractive index measurement of optical thin-film | |
US4221964A | Control system for mass spectrometer | |
US4203199A | Solid state sensor | |
US4164861A | Leak standard generator | |
US4171341A | Solid state sensor | |
US4036167A | Apparatus for monitoring vacuum deposition processes |