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LEPAGE BENOIT

Overview
  • Total Patents
    14
  • GoodIP Patent Rank
    190,555
  • Filing trend
    ⇩ 100.0%
About

LEPAGE BENOIT has a total of 14 patent applications. It decreased the IP activity by 100.0%. Its first patent ever was published in 2008. It filed its patents most often in United States. Its main competitors in its focus markets measurement, electrical machinery and energy and medical technology are TAKEZAKI TEIJI, FERMISCAN AUSTRALIA PTY LTD and BROADMASTER BIOTECH CORP.

Patent filings in countries

World map showing LEPAGE BENOITs patent filings in countries
# Country Total Patents
#1 United States 14

Patent filings per year

Chart showing LEPAGE BENOITs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Lepage Benoit 14
#2 Painchaud-April Guillaume 2
#3 Habermehl Jason 1
#4 Langlois Pierre 1
#5 Drummy Michael 1
#6 St-Laurent Martin 1
#7 Grimard Charles 1
#8 Imbert Christophe 1
#9 Liu Chunyan Tricia 1

Latest patents

Publication Filing date Title
US2018000460A1 Gapless calibration method for phased array ultrasonic inspection
US2018231508A1 Ultrasonic inspection configuration with beam overlap verification
US2016290972A1 Method of conducting probe coupling calibration in a guided-wave inspection instrument
US2016238566A1 System and a method of automatically generating a phased array ultrasound scan plan for non-destructive inspection
US2015276679A1 Method for monitoring the integrity of an eddy current inspection channel
US2014035568A1 Assembly with a universal manipulator for inspecting dovetail of different sizes
US2013249540A1 Eddy current array probe and method for lift-off compensation during operation without known lift references
US2012206132A1 Shielded eddy current coils and methods for forming same on printed circuit boards
US2012025816A1 Orthogonal eddy current probe for multi-directional inspection
US2012007595A1 2D coil and a method of obtaining EC response of 3D coils using the 2D coil configuration
US2011234212A1 Magnetic flux leakage inspection device
US2011118991A1 Multi-frequency bond testing
US2009091318A1 Phased scan eddy current array probe and a phased scanning method which provide complete and continuous coverage of a test surface without mechanical scanning