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LEICA MIKROSYSTEME GMBH

Overview
  • Total Patents
    157
  • GoodIP Patent Rank
    38,802
  • Filing trend
    ⇧ 25.0%
About

LEICA MIKROSYSTEME GMBH has a total of 157 patent applications. It increased the IP activity by 25.0%. Its first patent ever was published in 1999. It filed its patents most often in United States, Germany and Japan. Its main competitors in its focus markets measurement, machines and optics are OI CORP, IONALYTICS CORP and PERKINELMER LIFE & ANALYTICAL SCIENCES.

Patent filings per year

Chart showing LEICA MIKROSYSTEME GMBHs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Lihl Reinhard 45
#2 Wurzinger Paul 31
#3 Lang Anton 30
#4 Zimmermann Michael 29
#5 Plank Heinz 23
#6 Wogritsch Rainer 19
#7 Gaechter Leander 18
#8 Goll Hubert 12
#9 Pfeifer Thomas 11
#10 Ranner Robert 9

Latest patents

Publication Filing date Title
DE102019102438B3 Microscopic imaging method and system therefor, and use therefor
DE102018132227A1 Process for generating a section series, process for three-dimensional reconstruction of a microscopic sample and microtome system
EP3385771A1 Holding device for a sample holder and method for introducing and removing of a sample holder
EP3287775A1 Modular specimen holders for high pressure freezing and x-ray crystallography of a specimen
EP3175279A1 Light microscope having a sample stage for cryomicroscopy
DE102015100727A1 Sample transfer device
DE102014118801A1 Freeze-fracture machine
CN107003065A The refrigerator of container with the sample for freezing
DE102014110722A1 Charging station for reloading frozen samples at low temperatures
KR20130136385A Method for coating with an evaporation material
KR20130136384A Apparatus for preparing, in particular coating, samples
DE102013003164A1 Apparatus for light stimulation and cryopreservation of biological samples
AT512227A1 System for cooling a sample in a device for processing the sample
AT510606B1 DEVICE AND METHOD FOR SAMPLE PREPARATION
AT509608B1 Device and method for cooling samples during one ion beam preparation
AT507572A4 Process for segment control of a knife cutting
AT508018B1 Kryopräparationskammer for manipulating a sample for electronic microscopy
AT508017B1 Transfer of a sample carrier in correlative electronic microscopy
AT508582A1 Method for producing a water-resistant sample included in a sample container and a sample container for implementing the process
AT507079B1 Device and method for preparing samples