LAU KAM C has a total of 18 patent applications. Its first patent ever was published in 1996. It filed its patents most often in United States, EPO (European Patent Office) and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets measurement, control and optics are BRIDGES ROBERT E, FARO TECH INC and KUBO AKIO.
# | Country | Total Patents | |
---|---|---|---|
#1 | United States | 9 | |
#2 | EPO (European Patent Office) | 4 | |
#3 | WIPO (World Intellectual Property Organization) | 4 | |
#4 | China | 1 |
# | Industry | |
---|---|---|
#1 | Measurement | |
#2 | Control | |
#3 | Optics | |
#4 | Packaging and shipping |
# | Technology | |
---|---|---|
#1 | Measuring length, angles and areas | |
#2 | Measuring distances | |
#3 | Radio navigation | |
#4 | Control or regulating systems | |
#5 | Optical systems | |
#6 | Manipulators | |
#7 | Measuring light | |
#8 | Special measuring |
# | Name | Total Patents |
---|---|---|
#1 | Lau Kam C | 17 |
#2 | Liu Yuanqun | 4 |
#3 | Ma Quanhe | 1 |
#4 | Xie Liangyun | 1 |
#5 | Qiao Guixiu | 1 |
#6 | Liu Yuan-Qen | 1 |
#7 | Lau Herbert | 1 |
Publication | Filing date | Title |
---|---|---|
US2010176270A1 | Volumetric error compensation system with laser tracker and active target | |
US2010149525A1 | Multi-dimensional measuring system with measuring instrument having 360° angular working range | |
US2009144999A1 | Interior contour measurement probe | |
US2007153297A1 | Photogrammetric Targets | |
US2006033931A1 | System and method for three-dimensional measurement | |
US7230689B2 | Multi-dimensional measuring system | |
EP0866954A1 | Five-axis/six-axis laser measuring system | |
US6269284B1 | Real time machine tool error correction using global differential wet modeling | |
EP0896656A1 | On-machine ballbar system and method for using the same |