LAI FANG-SHI JORDAN has a total of 13 patent applications. Its first patent ever was published in 2007. It filed its patents most often in United States. Its main competitors in its focus markets basic communication technologies, semiconductors and measurement are CHINA ELECTRONIC TECH CORPORATION 24TH RESEARCH INSTITUTE, KENET INC and SUGAWARA MITSUTOSHI.
# | Country | Total Patents | |
---|---|---|---|
#1 | United States | 13 |
# | Industry | |
---|---|---|
#1 | Basic communication technologies | |
#2 | Semiconductors | |
#3 | Measurement | |
#4 | Control |
# | Technology | |
---|---|---|
#1 | Code conversion | |
#2 | Semiconductor devices | |
#3 | Systems for regulating electrical variables | |
#4 | Measuring electric variables |
# | Name | Total Patents |
---|---|---|
#1 | Lai Fang-Shi Jordan | 13 |
#2 | Hsueh Hsu-Feng | 11 |
#3 | Lin Yung-Fu | 10 |
#4 | Weng Cheng Yen | 10 |
#5 | Wang Kuo-Ming | 6 |
#6 | Mhala Manoj M | 5 |
#7 | Chang Chin-Hao | 5 |
#8 | Ho Chiahua | 2 |
#9 | Lu Chih-Cheng | 2 |
#10 | Yang Fu-Liang | 2 |
Publication | Filing date | Title |
---|---|---|
US2013141260A1 | Pipeline analog-to-digital converter | |
US2013015876A1 | Apparatus and method for measuring degradation of CMOS VLSI elements | |
US2012212359A1 | ADC calibration apparatus | |
US2012081244A1 | Method and apparatus for analog to digital conversion | |
US2012075132A1 | Method and apparatus for calibrating sigma-delta modulator | |
US2011037632A1 | ADC calibration | |
US2011037631A1 | DAC calibration | |
US2011012763A1 | Background calibration of analog-to-digital converters | |
US2009108249A1 | Phase Change Memory with Diodes Embedded in Substrate | |
US2009096509A1 | Bandgap Reference Circuits for Providing Accurate Sub-1V Voltages |