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KUSHIBIKI JUNICHI

Overview
  • Total Patents
    12
  • GoodIP Patent Rank
    216,621
About

KUSHIBIKI JUNICHI has a total of 12 patent applications. Its first patent ever was published in 1998. It filed its patents most often in Japan and United States. Its main competitors in its focus markets measurement, materials and metallurgy and machines are KRAUTKRAEMER JAPAN, ACOSENSE AB and HAGER ENVIRONMENTAL AND ATMOSPHERIC TECHNOLOGIES LLC.

Patent filings in countries

World map showing KUSHIBIKI JUNICHIs patent filings in countries
# Country Total Patents
#1 Japan 10
#2 United States 2

Patent filings per year

Chart showing KUSHIBIKI JUNICHIs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Kushibiki Junichi 12
#2 Ohashi Yuji 6
#3 Arakawa Mototaka 5
#4 Ono Takeshi 2
#5 Shirasaki Yuichi 1
#6 Hirohashi Junji 1
#7 Takeda Nobuo 1
#8 Okabe Ryoichi 1
#9 Watanabe Izumi 1
#10 Kawaguchi Kuniko 1

Latest patents

Publication Filing date Title
JP2015190976A Method for determining sound related physical constant of piezoelectric single crystal/ceramic material, method for determining temperature coefficient of sound related physical constant using the same and method for determining optimal crystal orientation and propagation direction using method for determining temperature coefficient
JP2015175830A Measurement method of surface characteristic of reinforced glass
US2013103342A1 Method of Measuring Fictive Temperature of Optical Glass
US2012289393A1 Method for Producing Ulta-Low-Expansion Glass
JP2005289676A Method for determining raw material composition for producing ferroelectric single crystal, and method for calibrating curie temperature of ferroelectric single crystal
JP2005114429A Ultrasonic material property analyzer of high precision, and temperature control method therefor
JP2002267640A Method of evaluating material by ultrasonic measurement
JP2002257502A Device and method for measuring thickness
JP2002131295A Lsaw propagation characteristics measurement method and device
JP2000275194A Calibration method of ultra-precise x-ray diffraction apparatus
JPH11281634A Ultrasonic microscope device for quantitative measurement
JPH11258216A Lsaw propagation characteristic measuring method by ultrasonic microscope