KARIM KARIM S has a total of 33 patent applications. It decreased the IP activity by 91.0%. Its first patent ever was published in 2005. It filed its patents most often in Canada, United States and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets measurement, medical technology and semiconductors are SHENZHEN XPECTVISION TECHNOLOGY CO LTD, SHENZHEN XPECTVISION TECH CO LTD and DIGIRAD.
# | Country | Total Patents | |
---|---|---|---|
#1 | Canada | 10 | |
#2 | United States | 9 | |
#3 | WIPO (World Intellectual Property Organization) | 7 | |
#4 | EPO (European Patent Office) | 3 | |
#5 | China | 2 | |
#6 | Republic of Korea | 2 |
# | Industry | |
---|---|---|
#1 | Measurement | |
#2 | Medical technology | |
#3 | Semiconductors | |
#4 | Audio-visual technology |
# | Technology | |
---|---|---|
#1 | Measuring nuclear radiation | |
#2 | Diagnosis and surgery | |
#3 | Semiconductor devices | |
#4 | Television | |
#5 | Analysing materials | |
#6 | Measuring light |
# | Name | Total Patents |
---|---|---|
#1 | Karim Karim S | 33 |
#2 | Cunningham Ian A | 13 |
#3 | Goldan Amirhossein | 10 |
#4 | Lopez Maurino Sebastian | 7 |
#5 | Abbaszadeh Shiva | 3 |
#6 | Allec Nicholas | 3 |
#7 | Wang Kai | 3 |
#8 | Haji-Khamneh Bahman | 3 |
#9 | Goldan Amir | 1 |
#10 | Ghanbarzadeh Sina | 1 |
Publication | Filing date | Title |
---|---|---|
CN109073768A | system and method for X-ray detector | |
CA3014570A1 | Method and apparatus for improved detective quantum efficiency in an x-ray detector | |
US2017018588A1 | Apparatus for radiation detection in a digital imaging system | |
WO2013082721A1 | Radiation detector system and method of manufacture | |
US2012106698A1 | Multi-layer flat panel X-ray detector | |
WO2010142036A1 | Radiation detector with integrated readout | |
US2012038013A1 | Method and apparatus for a lateral radiation detector | |
CA2650066A1 | Photon counting and integrating pixel readout architecture with dynamic switching operation | |
CA2615827A1 | Method and apparatus for single-polarity charge sensing for semiconductor radiation detectors deposited by physical vapor deposition techniques | |
CA2513592A1 | Photon counting digital imaging apparatus and system | |
CA2494602A1 | Digital imaging apparatus and system |