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JURCA OPTOELEKTRONIK GMBH

Overview
  • Total Patents
    25
About

JURCA OPTOELEKTRONIK GMBH has a total of 25 patent applications. Its first patent ever was published in 1995. It filed its patents most often in Germany, WIPO (World Intellectual Property Organization) and EPO (European Patent Office). Its main competitors in its focus markets optics, machine tools and measurement are WATANABE HITOSHI, LASERTEK OY and VINNOSYS.

Patent filings in countries

World map showing JURCA OPTOELEKTRONIK GMBHs patent filings in countries
# Country Total Patents
#1 Germany 14
#2 WIPO (World Intellectual Property Organization) 6
#3 EPO (European Patent Office) 3
#4 United States 2

Patent filings per year

Chart showing JURCA OPTOELEKTRONIK GMBHs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Jurca Marius 15
#2 Jakob Gerd 10
#3 Marschall Michael 10
#4 Reuter Arnulf 10
#5 Jurca Marius Christian 5
#6 Jurca Marius Dipl Ing 4
#7 Reuter Arnulf Dr Ing 3
#8 Dietz Christoph 3
#9 Jakob Gerd Dipl Ing 3
#10 Marschall Michael Dipl Ing 3

Latest patents

Publication Filing date Title
DE19853915A1 Detecting three-dimensional structure and displaying to blind or visually impaired person by converting optically detected structure into tactile relief
DE19853912A1 Electronic glasses
DE19839930C1 Checking the functioning of a transparent protective element for a transparent optical unit of a laser unit
DE19736879A1 Backlight
DE19736880C1 Electronic spectacles as viewing aid
DE19724986A1 Process for welding workpieces and device for carrying them out
DE19724140A1 Electronic glasses, in particular night vision glasses
DE19724139C1 Electronic glasses
DE19724141A1 Night vision glasses
DE19630437A1 detecting device
DE19618883A1 Device and method for the photorefractive correction of ametropia
DE19609784A1 Apparatus for laser beam deflection
DE19522493A1 Method for determining the instantaneous penetration depth of a machining laser beam into a workpiece and device for carrying out this method
DE19521961A1 Method and device for determining the distance between a base and a reflecting surface by means of radiation reflected on the surface