| # | Country | Total Patents | |
|---|---|---|---|
| #1 | Republic of Korea | 4 | |
| #2 | Australia | 3 | |
| #3 | EPO (European Patent Office) | 2 | |
| #4 | United States | 2 | |
| #5 | WIPO (World Intellectual Property Organization) | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Surface technology and coating | |
| #3 | Electrical machinery and energy | |
| #4 | Semiconductors | |
| #5 | Chemical engineering |
| # | Technology | |
|---|---|---|
| #1 | Measuring length, angles and areas | |
| #2 | Analysing materials | |
| #3 | Coating metallic material | |
| #4 | Electric discharge tubes | |
| #5 | Plasma technique | |
| #6 | Semiconductor devices |
| # | Name | Total Patents |
|---|---|---|
| #1 | Siniaguine Oleg | 5 |
| #2 | Ledger Anthony M | 3 |
| #3 | Latypov Azat M | 3 |
| #4 | Tokmouline Iskander | 3 |
| #5 | Gomez Alexander A | 2 |
| #6 | Gardopee George J | 2 |
| #7 | Gratrix Edward J | 1 |
| #8 | Robbins Michael D | 1 |
| #9 | America William G | 1 |
| #10 | Steinberg George | 1 |
| Publication | Filing date | Title |
|---|---|---|
| US6275770B1 | Method to remove station-induced error pattern from measured object characteristics and compensate the measured object characteristics with the error | |
| US6242926B1 | Method and apparatus for moving an article relative to and between a pair of thickness measuring probes to develop a thickness map for the article |