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INST TEORETICHESKOJ I EX FIZ

Overview
  • Total Patents
    18
About

INST TEORETICHESKOJ I EX FIZ has a total of 18 patent applications. Its first patent ever was published in 1991. It filed its patents most often in Russian Federation. Its main competitors in its focus markets machines are SUPER FINE LTD, HUZHOU FENGSHENG NEW MAT CO LTD and BENEKE RICHARD.

Patent filings in countries

World map showing INST TEORETICHESKOJ I EX FIZs patent filings in countries
# Country Total Patents
#1 Russian Federation 18

Patent filings per year

Chart showing INST TEORETICHESKOJ I EX FIZs patent filings per year from 1900 to 2020

Focus industries

# Industry
#1 Machines

Focus technologies

# Technology
#1 Milling

Top inventors

# Name Total Patents
#1 Radko Valerij E 5
#2 Lapitskij Yurij Ya 3
#3 Kushin Viktor V 3
#4 Balabin Anatolij I 2
#5 Kropachev Gennadij N 2
#6 Ugarov Sergej B 1
#7 Onosovskij Konstantin K 1
#8 Vengrov Remir M 1
#9 Smirnov Lev S 1
#10 Skachkov Sergej V 1

Latest patents

Publication Filing date Title
RU95101223A Enclosed radioactive source and its production process
RU94036276A Device for generation of ultra-short pulses of accelerated ions current in linear accelerator
RU2087986C1 Ion-optical system with magnetic protection of electrodes
RU2098799C1 Method of gamma-stereoscopy
RU2098800C1 Gamma-stereoscopy device
RU2080183C1 Gear for electric pulse break of materials
RU2098883C1 Proton pulse source with cathode cone
RU2045136C1 Method of focusing beam of charged particles in linear resonance accelerator
RU2045135C1 Multichannel linear cavity-type accelerator
RU2034657C1 Electric pulse crusher
RU2077734C1 Device for recording spatial displacements
RU2035748C1 Method of making gamma-ray quantum source-absorber
RU2080589C1 Gamma-ray flaw detector
RU2038708C1 Accelerating unit for linear resonant ion accelerator having grid focusing
RU2058612C1 Probing emitter manufacturing process for tunnel microscopy
RU2035724C1 Ceramics for profiled anvils of high pressure chamber
RU2050043C1 Method for generation of secondary particles
RU2053521C1 Magnetic field meter