Method for identification of the impact of acoustic interferences on etching of patterns by means of a focused ion beams in the FIB device
PL414888A1
System for optical measurements of a degree and frequency of deflection of moving elements in the micro- and nano-mechanical structures
PL414336A1
Method for producing zinc-based porous layer
PL412613A1
Structure of a transparent ultraviolet detector and method for producing the structure of the transparent ultraviolet detector
PL412496A1
Method for execution of radiation limitation in the cascade laser structures with the plasma waveguide
PL411709A1
Silicon photodiode
PL411059A1
Supercapacitor structure and method for manufacturing the supercapacitor structure plates
PL410653A1
Portable photovoltaic electric current generator integrated with the power collection and management system
PL410263A1
Electric contact for testing materials seated on the insulating substrate
PL409748A1
Method for producing transparent amorphous layer of indium gallium zinc oxide semiconductor (IGZO) with developed surface
PL409491A1
Semiconductor thermoelectric matrix
PL409355A1
Thermoelectric detector
PL408718A1
Method for manufacturing transparent MESFET transistor
PL408272A1
Thermo-electric electric current generator
PL408058A1
Structure for producing the ohm contact to the substrate of silicon carbide type n, and method for producing the ohm contact to the substrate of silicon carbide type n
PL407767A1
Method for the determination of chemical composition and concentration of gases and the sensor for determination of chemical composition and concentration of gases
PL407342A1
Method for producing semiconductor structures from the three-component AIII BV compounds
PL407338A1
Method for increasing accuracy for the determination of composition of the three-component thin layer, making one period in periodical structures
PL406581A1
Dual-mode heterostructure of the optically-pumped semiconductor laser
PL406473A1
Method for selective joining of flat semiconductor and/or dielectric elements
