RU94035348A
|
|
X-radiation lens
|
RU2080747C1
|
|
Device for electromagnetic processing of friable materials
|
RU94022102A
|
|
Plasma ion source
|
RU94021400A
|
|
Process of lithographic formation of structure
|
RU2079074C1
|
|
Method of materials drying
|
RU2085912C1
|
|
Atomic-fluorescent analyzer without dispersion
|
RU2062458C1
|
|
Method of measurement of deformation of surface of crystalline structure modulated periodically
|
RU2051445C1
|
|
Superconductor current amplifier using josephson effect
|
RU2012105C1
|
|
Ionistor
|
RU2038582C1
|
|
Dispersion-free atomic-fluorescent analyzer with wolfram spiral spray gun
|
RU2004024C1
|
|
Capacitor with double electric layer
|
RU1804613C
|
|
Method of measuring depth of microrelief on surface of solids
|
RU1697573C
|
|
Solid electrolyte
|
RU1614641C
|
|
Method of measuring concentration of admixtures in gases
|
RU1568805C
|
|
Device for microwave-plasma treatment of materials
|
RU1454116C
|
|
Process of photolithography
|