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INST ELEKTRONIKI AN BSSR

Overview
  • Total Patents
    341
About

INST ELEKTRONIKI AN BSSR has a total of 341 patent applications. Its first patent ever was published in 1975. It filed its patents most often in USSR (Union of Socialist Soviet Republics) and Russian Federation. Its main competitors in its focus markets semiconductors, optics and measurement are MA XIAOLONG, TECHNOLOGY RES ASS FOR ADVANCED DISPLAY MATERIALS and KODO EIZO GIJUTSU KENKYUSHO.

Patent filings in countries

World map showing INST ELEKTRONIKI AN BSSRs patent filings in countries

Patent filings per year

Chart showing INST ELEKTRONIKI AN BSSRs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Pilipovich Vladimir A 59
#2 Koleshko Vladimir M 51
#3 Ilin Viktor N 49
#4 Esman Aleksandr K 43
#5 Chekhovich Evgenij K 25
#6 Sunka Vasilij Ya 22
#7 Starkov Aleksej L 21
#8 Kuleshov Vladimir K 21
#9 Zajka Valerij A 20
#10 Romanov Aleksandr V 20

Latest patents

Publication Filing date Title
RU1812540C Raster grating
RU1824545C Method of determining refraction index of liquids in capillaries
RU1827540C Method for measuring diameter of single-fiber light guides
SU1762119A1 Method for checking diameter of one-conductor light-guides
RU1797040C Method of quality control of piezoceramic surface
RU1793193C Displacement transducer
RU2025038C1 Device for formation of voltage pulses
RU1769191C Position detector of mobile object in respect to alignment layer
RU2044266C1 Device for recording of holographic interferograms
RU1825969C Method for testing geometric parameters of capillary tubes
SU1756858A1 Thermoplastic record medium developing method
RU1800318C Device for measuring dimensions of particles
RU1776986C Microwire linear size check method
SU1755250A1 Method and device for recording holograms and holographic interferograms
RU1768962C Device for checking diameter of light guides and optical fibers
SU1737268A1 Device for recording holographic interferograms
SU1752353A1 Electronic stethoscope
RU1781537C Method of measurement of surface roughness of articles and device to implement it
RU1823036C Method for testing semiconductor structures
SU1744446A1 Object part coordinate meter