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CN1988158A
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Flat plate capacitor and its realizing method
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CN1988150A
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Static discharging protective element structure for improving trigger effect
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CN1988372A
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Sleeve type amplifier
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CN1988147A
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Semiconductor alignment detecting structure
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CN1988122A
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Method for marking silicon sheet edge
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CN1988180A
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Schottky diode
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CN1988115A
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Method for producing programmable device
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CN1983598A
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Semiconductor capacity
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CN1983588A
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Anti-electrostatic protecting structure by NMOS
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CN1982910A
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Method for testing EFlash serial interface based on selective bit number
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CN1983631A
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MOS field effective pipe and its production
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CN1983629A
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High-voltage MOS pipe grid oxydic film structure and its growth
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CN1981990A
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Chemical-mechanical polishing grinding pad
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CN1982213A
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Nozzle of polycrystalline-silicon furnace
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CN1982907A
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Method for testing transistor life
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CN1983520A
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Production of semiconductor anti-reflective layer
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CN1983528A
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Method for decreasing MOS field effect pipe reversed narrow channel effect
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CN1983523A
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Method for decreasing inleakage at STI bottom by high-voltage MOS process
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CN1982902A
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Method for analyzing BEOL testing chip on-line failure
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CN1983032A
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Scale and method for measuring photoetching alignment precision
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