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HNC INC

Overview
  • Total Patents
    27
  • GoodIP Patent Rank
    180,310
  • Filing trend
    ⇧ 300.0%
About

HNC INC has a total of 27 patent applications. It increased the IP activity by 300.0%. Its first patent ever was published in 1989. It filed its patents most often in Republic of Korea, United States and EPO (European Patent Office). Its main competitors in its focus markets computer technology, measurement and semiconductors are FAIR IP LLC, HNC SOFTWARE INC and FAIR ISAAC CORP.

Patent filings per year

Chart showing HNC INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Lazarus Michael A 3
#2 Means Robert W 3
#3 Sklar Horace J 3
#4 Ferguson William M 3
#5 Pathria Anu K 3
#6 Oh Jae Seok 3
#7 Gopinathan Krishna M 3
#8 Han Yun Seob 3
#9 Biafore Louis S 3
#10 Han Yoon Seop 3

Latest patents

Publication Filing date Title
KR102189754B1 Three way valve assembly
KR101982607B1 Automatic washing and drying apparatus of slurry filter for chemical mechanical polishing process
KR101959266B1 Fixing jig apparatus for discharge line of the semiconductor manufacturing equipment
KR101858201B1 Automatic combining and separating apparatus of slurry filter for chemical mechanical polishing process
KR101901977B1 Automatic combining and separating assembly of slurry filter charging system for chemical mechanical polishing process
KR20180108056A Three-way valve with temperature holding function
KR20170072517A None
KR20130080269A Displacement measuring apparatus, and displacement measuring method using the same
KR20130007222A Apparatus for seperating chip array substrate in rotary-braking type
KR20110119869A Illumination device and substrate inspection apparatus including the same
KR20100118814A Substrate inspection apparatus and substrate inspection method using the same
KR20100118815A Automatic insert system and automatic insert method using the same
KR20090112152A Auto attach system and auto attach method using the same
KR20090107814A Substrate inspection apparatus and substrate inspection method using the same
KR20090107815A Optical mesurement apparatus and inspection apparatus including the same
KR100791113B1 Non-contact type apparatus for measuring the height of needle of probe card
US5619709A System and method of context vector generation and retrieval
US5361201A Real estate appraisal using predictive modeling
US5325298A Methods for generating or revising context vectors for a plurality of word stems
EP0468229A2 A neural network with expert system functionality