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HITACHI HIGH-TECH CORP

Overview
  • Total Patents
    51
  • GoodIP Patent Rank
    30,007
  • Filing trend
    ⇧ 333.0%
About

HITACHI HIGH-TECH CORP has a total of 51 patent applications. It increased the IP activity by 333.0%. Its first patent ever was published in 2009. It filed its patents most often in WIPO (World Intellectual Property Organization), Japan and EPO (European Patent Office). Its main competitors in its focus markets measurement, electrical machinery and energy and biotechnology are HITACHI HIGH TECHOLOGIES CORP, MDS INC DBT MDS SCIEX DIVISION and ASTA CO LTD.

Patent filings per year

Chart showing HITACHI HIGH-TECH CORPs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Okusa Takenori 3
#2 Matsuoka Yuya 2
#3 Kambara Katsuhiro 2
#4 Takasu Hisayuki 2
#5 Naoshi Itabashi 2
#6 Kanda Katsuhiro 2
#7 Makino Akihisa 2
#8 Mori Takamichi 2
#9 Onizawa Kuniaki 2
#10 Inoue Tomomi 2

Latest patents

Publication Filing date Title
WO2020171240A1 Analysis device
WO2020170834A1 Control system and automatic analysis device mounted with said control system
WO2020162484A1 Specimen treatment system
WO2020162438A1 Liquid chromatograph mass spectrometer
WO2020170751A1 Automated analyzer
WO2020170636A1 Automated analyzer
JP2020053406A Ion milling device and ion milling method
JP2020061569A Plasma processing apparatus, data processing apparatus and data processing method
WO2020162042A1 Automatic analysis device
WO2020166127A1 Sample rack, adaptor for sample rack, and automatic analysis device
WO2020170408A1 Charged particle beam device
WO2020170313A1 Cultivation container rack and analyzing device
WO2020166049A1 Defect inspection device and defect inspection method
WO2020166076A1 Structure estimation system and structure estimation program
WO2020161795A1 Charged particle beam device
WO2020157860A1 Charged particle beam system and charged particle beam imaging method
WO2020157809A1 Electron beam application device
JP2020067398A Sample determination system, sample automatic processing device using the same, and sample determination method
JP2020065383A Linear motor for vacuum and vacuum processor
JP2020056712A Simulation method and device for analyzer