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HIROSE TECH CO LTD

Overview
  • Total Patents
    26
About

HIROSE TECH CO LTD has a total of 26 patent applications. Its first patent ever was published in 2005. It filed its patents most often in Taiwan and China. Its main competitors in its focus markets environmental technology, electrical machinery and energy and semiconductors are OOO NATSIONAL NAJA INNOVATSION, MATSUSHITA BATTERY IND and TOSHIBA INTERNAT FUEL CELLS CO.

Patent filings in countries

World map showing HIROSE TECH CO LTDs patent filings in countries
# Country Total Patents
#1 Taiwan 24
#2 China 2

Patent filings per year

Chart showing HIROSE TECH CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Chen Hong-Li 5
#2 Chiu Wen-Chun 5
#3 Lee Tung-Feng 4
#4 Ye Xin-Wen 3
#5 Xie Chong-Wen 2
#6 Lin Tai-Hong 2
#7 Yang Yi-Min 1
#8 Huang Xu-Hua 1
#9 Yeh Shih-Hung 1
#10 Kunxian Zheng 1

Latest patents

Publication Filing date Title
TW201420496A Method for manufacturing LiFePO4 material
TW201416315A Method for preparing lithium phosphate metal salt applied in wide temperature range
TW201345017A Composite powder for making electrode and electrochemical device using the same
TW201327998A Method for controlling coating density of positive electrode material for lithium battery
TW201323322A Porous lithium phosphate metal salt and method for preparing the same
CN102708770A System and method for detecting defect of flat panel display
TW201237444A Methode and system for flat panel display defect inspection
TW201207355A Device for 3-D profile measurement by longitudinal chromatic aberration
TW201202123A Manufacturing equipment of nano-scale structure array and production method
CN102135664A Light beam correcting projection equipment
TW201126201A Beam correcting projection apparatus
TW201107817A Image inspection apparatus
TW201021947A Aluminum tape welding equipment
TW201021937A Feeding and cutting device for aluminum tape
TW200949144A Lamp box equipment and lamp tube performance monitoring apparatus and method
TW200949984A Panel holder and panel inspection machine table
TW200936982A Method and apparatus for measuring the thickness of object
TW200846622A Measuring method that detects the surface contour of a test object by utilizing the detection of the peak of an interference wave
TW200831888A Light illumination control system
TW200829856A Method of measuring the surface contour of object by the use of coherence envelope peak detection