| # | Country | Total Patents | |
|---|---|---|---|
| #1 | China | 5 | |
| #2 | EPO (European Patent Office) | 5 | |
| #3 | WIPO (World Intellectual Property Organization) | 5 | |
| #4 | Germany | 2 | |
| #5 | Taiwan | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Semiconductors | |
| #3 | Packaging and shipping |
| # | Name | Total Patents |
|---|---|---|
| #1 | Jansen Stephan | 6 |
| #2 | Esser Thomas | 6 |
| #3 | Starkens Heinz | 5 |
| #4 | Piskorski Gregor | 4 |
| #5 | Odenthal Heinz F | 3 |
| #6 | Hennecke Peter | 3 |
| #7 | Peters Rainer | 2 |
| #8 | Windeln Wilbert | 2 |
| #9 | Hennecke Heinrich Peter | 2 |
| #10 | Kesseler Rudolf | 2 |
| Publication | Filing date | Title |
|---|---|---|
| DE102018130595A1 | Sensor station and method for measuring wafers | |
| DE102018112706A1 | Wafer line and method for conveying wafers | |
| EP3514825A1 | Wafer sorting apparatus | |
| EP3081901A1 | Inspection method and device for inspecting a surface pattern | |
| EP2781912A1 | Inspection system | |
| EP2600140A1 | Inspection system | |
| EP2256796A1 | Device for transporting wafers and/or solar cells |