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HELMUT FISCHER GMBH & CO

Overview
  • Total Patents
    110
About

HELMUT FISCHER GMBH & CO has a total of 110 patent applications. Its first patent ever was published in 1969. It filed its patents most often in Germany, United Kingdom and Japan. Its main competitors in its focus markets measurement, packaging and shipping and machines are PUUMALAINEN PERTTI, FORTE FAIRBAIRN INC and TEITSUU DENSHI KENKYUSHO KK.

Patent filings per year

Chart showing HELMUT FISCHER GMBH & COs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Fischer Helmut 48
#2 Kaiser Karl-Heinz 8
#3 Roessiger Volker 8
#4 Ott Albert Dipl Ing 7
#5 Herumuuto Fuitsushiyaa 7
#6 Roesiger Volker 6
#7 Rossiger Volker 4
#8 Steegmueller Willi 3
#9 Volz Werner 2
#10 Kaiser Karl Heinz 2

Latest patents

Publication Filing date Title
DE10013048A1 Position adjusting method for layer thickness measurement involves varying space between surface of measurement object and collimator to change brightness of pixels on measurement plane
FR2804894A1 Handling module for at least one building element and intended for insertion or extraction of building element in or out of a support for construction elements
GB0002677D0 Handling module for at least one component for mounting on and removal from a component carrier
DE19954520A1 Device for guiding X-rays
DE19911011A1 Flow cell for analysis of liquids by X-ray fluorescence has base member provided with feed in- and outlet connections
DE19901624A1 Component carrier
DE19836884C1 Determination of the measurement spot in the X-ray fluorescence analysis
DE19739321A1 Method and device for determining the measurement uncertainty in X-ray fluorescence layer thickness measurements
DE19710420A1 Method and device for measuring the thicknesses of thin layers by means of X-ray fluorescence
DE19702950A1 Method and device for measuring the layer thickness on small cylindrical parts
DE19618774A1 X-ray fluorescence method for determining the composition of a material and device for carrying out such a method
SG132694G Device for a measuring probe
DE4338211A1 Device and method for coulometric measurement of the thickness of metallic coatings
JPH06213611A Device for measuring thickness of thin film
DE4203887A1 Positioning device for a measuring device
DE4129687A1 Device for measuring the thickness of thin layers
JPH0518704A Method and device for measuring thin layer
GB9113639D0 Method and probe for measuring the thickness of a thin layer
JPH0372210A Device for microprobe
GB8917448D0 Microprobe