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HELIOS MESSTECHNIK

Overview
  • Total Patents
    13
About

HELIOS MESSTECHNIK has a total of 13 patent applications. Its first patent ever was published in 1987. It filed its patents most often in Germany, WIPO (World Intellectual Property Organization) and EPO (European Patent Office). Its main competitors in its focus markets measurement and control are ROCH PIERRE ETS, BAGEL LABS CO LTD and SHINWA RULES.

Patent filings in countries

World map showing HELIOS MESSTECHNIKs patent filings in countries

Patent filings per year

Chart showing HELIOS MESSTECHNIKs patent filings per year from 1900 to 2020

Focus industries

# Industry
#1 Measurement
#2 Control

Top inventors

# Name Total Patents
#1 Perthen Guenther 4
#2 Meyer Ernst 3
#3 Waeldele Martin 2
#4 Keller Alexander 2
#5 Kindel Kai-Uwe 2
#6 Wolf Gerhard 2
#7 Weber Harald 2
#8 Both Markus 2
#9 Gebert Dieter 1
#10 Gaertner Gerhard 1

Latest patents

Publication Filing date Title
DE102004043691A1 Device for measuring the geometric dimensions and / or the shape of a gene stand, in particular a workpiece
DE10322357A1 Vernier calipers or micrometer for measuring linear dimensions of an object have an additional torque sensor for measuring mechanical deformation or tilting so that it can be compensated for in dimensional measurements
DE10322365A1 Apparatus for measuring the length, the thickness or similar linear dimensions of an object, in particular push and screw gauge with a floating measuring system
DE10321899B3 Vernier calipers have an alignment arrangement for the sliding carriage of the moving jaw that prevents its pivoting when the jaw is held against an object to be measured
DE10321900A1 Device for measuring the length, the thickness or similar linear dimensions of an object, in particular slide guide with extended guide
DE10124552A1 Device for measuring the geometric dimensions of a workpiece, in particular a caliper or caliper
WO0177610A1 Device and method for measuring objects in three dimensions
EP0644397A2 Large measuring range linear electronic slide gauge.
DE3930273A1 Measurement interferometer supplied with light from laser - is stimulated by laser diodes and has reference interferometer in control loop for frequency stabilisation
DE3909116A1 Electronic measuring tools and gauges with an overhung microprocessor system
DE3723055A1 Vernier calliper having relatively large measuring ranges and assembled from completely prefabricated individual parts