| # | Country | Total Patents | |
|---|---|---|---|
| #1 | EPO (European Patent Office) | 4 | |
| #2 | Japan | 3 | |
| #3 | Taiwan | 3 | |
| #4 | United States | 3 | |
| #5 | China | 2 | |
| #6 | Republic of Korea | 2 | |
| #7 | Israel | 1 | |
| #8 | Singapore | 1 |
| # | Industry | |
|---|---|---|
| #1 | Biotechnology | |
| #2 | Measurement | |
| #3 | Semiconductors | |
| #4 | Organic fine chemistry |
| # | Technology | |
|---|---|---|
| #1 | Analysing materials | |
| #2 | Measuring microorganism processes | |
| #3 | Semiconductor devices | |
| #4 | Microorganisms | |
| #5 | Sugars |
| # | Name | Total Patents |
|---|---|---|
| #1 | Chen Wen-Yih | 8 |
| #2 | Yang Yuh-Shyong | 8 |
| #3 | Chan Hardy Wai-Hong | 7 |
| #4 | Lin Ming-Yu | 6 |
| #5 | Chen Lin-Chien | 5 |
| #6 | Lee Cheng-Che | 4 |
| #7 | Hardy Wai-Hong Chan | 3 |
| #8 | Chen Wen Yih | 2 |
| #9 | Yuh-Shyong Yang | 2 |
| #10 | Wen-Yih Chen | 2 |
| Publication | Filing date | Title |
|---|---|---|
| JP2020129654A | Method for multi-level etch, semiconductor sensing device, and method for manufacturing semiconductor sensing device | |
| SG10201709799SA | Method for quantitatively profiling nucleic acids |