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HEFEI ADVANTOOLS SEMICONDUCTOR CO LTD

Overview
  • Total Patents
    45
  • GoodIP Patent Rank
    105,100
About

HEFEI ADVANTOOLS SEMICONDUCTOR CO LTD has a total of 45 patent applications. Its first patent ever was published in 2011. It filed its patents most often in China. Its main competitors in its focus markets audio-visual technology are PANATSUKU KK, TOKYO PURINTO KOUGIYOU KK and NAUCHNO-ISSLEDOVATEL'SKIJ TEKH INSTITUT.

Patent filings in countries

World map showing HEFEI ADVANTOOLS SEMICONDUCTOR CO LTDs patent filings in countries
# Country Total Patents
#1 China 45

Patent filings per year

Chart showing HEFEI ADVANTOOLS SEMICONDUCTOR CO LTDs patent filings per year from 1900 to 2020

Focus industries

Focus technologies

Top inventors

# Name Total Patents
#1 Xiang Zongqi 7
#2 Wang Xiaoguang 6
#3 Zhang Lei 5
#4 He Shaofeng 5
#5 Fang Lin 5
#6 Xianjie Li 4
#7 Wenhai Liu 4
#8 Li Xiangbin 3
#9 Lin Fang 3
#10 Liang Zhu 3

Latest patents

Publication Filing date Title
CN105115426A Detection method of figure splicing errors of laser direct imaging device
CN104965393A Exposure lens protection structure
CN105101644A Small-size printed circuit board (PCB) clamping device
CN104950599A LDI double workpiece exposure device and exposure method
CN104965395A Fixed focusing device for photoetching direct-writing system
CN104950598A Up-and-down distributed double-workpiece-stage device
CN104950595A Edge-on mounting type double-workpiece-table device
CN104950597A Standard double-workpiece-table device
CN104932207A Position synchronization method for direct-writing photoetching equipment
CN104914679A Multi-functional high-capacity chuck for semiconductor photoetching
CN104950591A Air channel structure of high-yield magnetic chuck
CN104820344A Precision positioning platform Yaw value measurement method
CN104678717A Vacuum cup pipeline structure capable of realizing two-degree-of-freedom movement
CN105549346A Method for acquiring optimal focal plane distance of laser direct imaging equipment
CN104281012A Gas shielded lens
CN104199257A Method for measuring and compensating absolute positioning accuracy of precise positioning platform
CN102736448A Compression method for image gradation data in direct writing lithography system
CN102736449A Tilt-scanned image data compression method in direct-write lithography system
CN102736447A Compression method for image data string in direct writing lithography system
CN102707581A Distortion compensation method of lithography objective