| # | Country | Total Patents | |
|---|---|---|---|
| #1 | Republic of Korea | 5 | |
| #2 | Taiwan | 3 | |
| #3 | China | 2 | |
| #4 | United States | 2 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Optics | |
| #3 | Audio-visual technology | |
| #4 | Computer technology | |
| #5 | Packaging and shipping |
| # | Technology | |
|---|---|---|
| #1 | Optical systems | |
| #2 | Analysing materials | |
| #3 | Measuring length, angles and areas | |
| #4 | Nonlinear optics | |
| #5 | Image data processing | |
| #6 | Measuring electric variables | |
| #7 | Television | |
| #8 | Transport or storage devices |
| # | Name | Total Patents |
|---|---|---|
| #1 | Rhew Choongyop | 3 |
| #2 | Lee Seungkeun | 3 |
| #3 | Park Daisoung | 3 |
| #4 | An Hyeon Goo | 2 |
| #5 | Park Do Kyong | 2 |
| #6 | Im Hyung Sik | 1 |
| #7 | Lee Seung-Keun | 1 |
| #8 | Park Jong Sun | 1 |
| #9 | Rhew Choong-Yop | 1 |
| #10 | Jung Seung Hwan | 1 |
| Publication | Filing date | Title |
|---|---|---|
| KR20160108643A | bonding wire chip inspection apparatus | |
| KR20160108644A | Device for detecting defect of device | |
| KR101600996B1 | Backlight unit with high color uniformity and display apparatus using the same | |
| KR101540179B1 | Review measurement path algorithm | |
| KR20130077709A | Back light unit and optical display apparatus comprising the same |