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GII ACQUISITION LLC

Overview
  • Total Patents
    31
  • GoodIP Patent Rank
    140,203
  • Filing trend
    ⇩ 100.0%
About

GII ACQUISITION LLC has a total of 31 patent applications. It decreased the IP activity by 100.0%. Its first patent ever was published in 2006. It filed its patents most often in United States. Its main competitors in its focus markets measurement, machines and computer technology are MEPS, GII ACQUISITION LLC DBA GENERAL INSPECTION LLC and SAINT GOBAIN CINEMATIQUE.

Patent filings in countries

World map showing GII ACQUISITION LLCs patent filings in countries
# Country Total Patents
#1 United States 31

Patent filings per year

Chart showing GII ACQUISITION LLCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Nygaard Michael G 19
#2 Spalding John D 10
#3 Kujacznski Nathan Andrew-Paul 8
#4 St Onge James W 6
#5 Nygaard Gregory Martin 2
#6 Poletti Laura L 2
#7 Fleming Christopher C 2
#8 Nygaard Michael George 2
#9 Alexander Christopher Michael 2
#10 Nygaard Gregory M 2

Latest patents

Publication Filing date Title
US2017333953A1 Method and system for inspecting a manufactured part at an inspection station
US2017307541A1 Method and system for optically inspecting headed manufactured parts
US2017307538A1 Method and system for optically inspecting headed manufactured parts
US2016231253A1 Method and system for optically inspecting parts
US2016109383A1 Method and system for optically inspecting the ends of a manufactured part at a single inspection station having a measurement axis
US2015290683A1 High speed method and system for inspecting a stream of parts at a pair of inspection stations
US2017216889A1 High speed method and system for inspecting a stream of parts
US2015204798A1 Non-contact method and system for inspecting a manufactured part at an inspection station having a measurement axis
US2014346097A1 High speed method and system for inspecting a stream of parts
US2014346095A1 High-speed, high-resolution, triangulation-based, 3-D method and system for inspecting manufactured parts and sorting the inspected parts
US2015055145A1 High-resolution imaging and processing method and system for increasing the range of a geometric dimension of a part that can be determined
US2015055144A1 High-resolution imaging and processing method and system for determining a geometric dimension of a part
US2014346094A1 High-speed, triangulation-based, 3-D method and system for inspecting manufactured parts and sorting the inspected parts
US2013258046A1 Method and system for optically inspecting outer peripheral surfaces of parts
US2014168661A1 High-speed, 3-D method and system for optically measuring a geometric dimension of manufactured parts
US2009103112A1 Non-contact method and system for inspecting parts
US2010073687A1 Method for precisely measuring position of a part to be inspected at a part inspection station
US2009103107A1 Method and system for inspecting parts utilizing triangulation
US2009100901A1 Calibration device for use in an optical part measuring system
US2009101851A1 Method for estimating thread parameters of a part