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GES ZUR FOERDERUNG ANGEWANDTER OPTIK OPTOELEKTRONIK QUANTENELEKTRONIK & SPEKTROSKOPIE EV

Overview
  • Total Patents
    29
About

GES ZUR FOERDERUNG ANGEWANDTER OPTIK OPTOELEKTRONIK QUANTENELEKTRONIK & SPEKTROSKOPIE EV has a total of 29 patent applications. Its first patent ever was published in 1994. It filed its patents most often in Germany, WIPO (World Intellectual Property Organization) and EPO (European Patent Office). Its main competitors in its focus markets measurement, electrical machinery and energy and semiconductors are Minkon GmbH, WYNNE GEORGE FREDERICK and INST KLINICHESKOJ EX MEDITSINY.

Patent filings in countries

World map showing GES ZUR FOERDERUNG ANGEWANDTER OPTIK OPTOELEKTRONIK QUANTENELEKTRONIK & SPEKTROSKOPIE EVs patent filings in countries

Patent filings per year

Chart showing GES ZUR FOERDERUNG ANGEWANDTER OPTIK OPTOELEKTRONIK QUANTENELEKTRONIK & SPEKTROSKOPIE EVs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Florek Stefan 21
#2 Becker-Ross Helmut 15
#3 Okruss Michael 10
#4 Wesemann Guenter 8
#5 Heitmann Uwe 7
#6 Becker-Ros Helmut 4
#7 Hoffmann Erwin 2
#8 Roland Carsten 2
#9 Skole Jochen 2
#10 Luedke Christian 2

Latest patents

Publication Filing date Title
DE102007028505A1 spectrometer arrangement
DE102004045315A1 Time of Flight Mass Spectrometer
DE102004028001A1 Echelle spectrometer with improved detector utilization
DE10347862A1 High resolution spectrometer
DE10223577A1 High resolution spectrometer with grid defect correction has at least one of optical mirror with variable surface so that grid defects causing curvature of wavefront are compensated
DE10205142A1 Arrangement and method for wavelength calibration in an Echelle spectrometer
DE10203439A1 Device for determining element concentrations in samples using a high-resolution spectrometer
DE10055905A1 Method for evaluating Echelle spectra
DE10011462A1 Optical spectrometer with astigmatism compensation
DE19961908A1 High-resolution Littrow spectrometer and method for quasi-simultaneous determination of a wavelength and a line profile
DE19502054A1 Laser appts. for single or multiple wavelength oscillation
DE4425874A1 Substrate carrier
DE4425879A1 Scoring system for separating components is essentially single crystal substrates