GES ZUR FOERDERUNG ANGEWANDTER OPTIK OPTOELEKTRONIK QUANTENELEKTRONIK & SPEKTROSKOPIE EV has a total of 29 patent applications. Its first patent ever was published in 1994. It filed its patents most often in Germany, WIPO (World Intellectual Property Organization) and EPO (European Patent Office). Its main competitors in its focus markets measurement, electrical machinery and energy and semiconductors are Minkon GmbH, WYNNE GEORGE FREDERICK and INST KLINICHESKOJ EX MEDITSINY.
# | Country | Total Patents | |
---|---|---|---|
#1 | Germany | 13 | |
#2 | WIPO (World Intellectual Property Organization) | 8 | |
#3 | EPO (European Patent Office) | 4 | |
#4 | China | 2 | |
#5 | United States | 2 |
# | Industry | |
---|---|---|
#1 | Measurement | |
#2 | Electrical machinery and energy | |
#3 | Semiconductors | |
#4 | Optics | |
#5 | Surface technology and coating | |
#6 | Machines |
# | Technology | |
---|---|---|
#1 | Measuring light | |
#2 | Analysing materials | |
#3 | Semiconductor devices | |
#4 | Electric discharge tubes | |
#5 | Coating metallic material | |
#6 | Working stone | |
#7 | Devices using light amplification |
# | Name | Total Patents |
---|---|---|
#1 | Florek Stefan | 21 |
#2 | Becker-Ross Helmut | 15 |
#3 | Okruss Michael | 10 |
#4 | Wesemann Guenter | 8 |
#5 | Heitmann Uwe | 7 |
#6 | Becker-Ros Helmut | 4 |
#7 | Hoffmann Erwin | 2 |
#8 | Roland Carsten | 2 |
#9 | Skole Jochen | 2 |
#10 | Luedke Christian | 2 |
Publication | Filing date | Title |
---|---|---|
DE102007028505A1 | spectrometer arrangement | |
DE102004045315A1 | Time of Flight Mass Spectrometer | |
DE102004028001A1 | Echelle spectrometer with improved detector utilization | |
DE10347862A1 | High resolution spectrometer | |
DE10223577A1 | High resolution spectrometer with grid defect correction has at least one of optical mirror with variable surface so that grid defects causing curvature of wavefront are compensated | |
DE10205142A1 | Arrangement and method for wavelength calibration in an Echelle spectrometer | |
DE10203439A1 | Device for determining element concentrations in samples using a high-resolution spectrometer | |
DE10055905A1 | Method for evaluating Echelle spectra | |
DE10011462A1 | Optical spectrometer with astigmatism compensation | |
DE19961908A1 | High-resolution Littrow spectrometer and method for quasi-simultaneous determination of a wavelength and a line profile | |
DE19502054A1 | Laser appts. for single or multiple wavelength oscillation | |
DE4425874A1 | Substrate carrier | |
DE4425879A1 | Scoring system for separating components is essentially single crystal substrates |