| # | Country | Total Patents | |
|---|---|---|---|
| #1 | EPO (European Patent Office) | 4 | |
| #2 | Israel | 4 | |
| #3 | WIPO (World Intellectual Property Organization) | 4 | |
| #4 | United States | 3 | |
| #5 | China | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Semiconductors | |
| #3 | Medical technology | |
| #4 | Environmental technology | |
| #5 | Surface technology and coating |
| # | Name | Total Patents |
|---|---|---|
| #1 | Szeles Csaba | 4 |
| #2 | Rundle David S | 4 |
| #3 | Hugg James W | 2 |
| #4 | Davis Robert K | 1 |
| #5 | Li Handong | 1 |
| #6 | Vydyanath Honnavalli R | 1 |
| #7 | Lynn Kelvin G | 1 |
| #8 | Prokesch Michael | 1 |
| #9 | Chakrabarti Utpal K | 1 |
| #10 | Grosholz Jr Joseph | 1 |
| Publication | Filing date | Title |
|---|---|---|
| WO2009155198A1 | Count correction in a photon counting imaging system | |
| US2009250692A1 | Radiation Detector With Asymmetric Contacts | |
| US2009095915A1 | Portable radiation detection system and method | |
| WO2009043003A1 | Correction method for photon counting imaging system | |
| WO2009042827A1 | Variable pixel pitch x-ray imaging system |