| # | Country | Total Patents | |
|---|---|---|---|
| #1 | EPO (European Patent Office) | 4 | |
| #2 | WIPO (World Intellectual Property Organization) | 3 | |
| #3 | Japan | 2 | |
| #4 | Canada | 1 | |
| #5 | United States | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Optics |
| # | Technology | |
|---|---|---|
| #1 | Analysing materials | |
| #2 | Measuring nuclear radiation | |
| #3 | Nonlinear optics | |
| #4 | Optical systems | |
| #5 | Measuring light |
| # | Name | Total Patents |
|---|---|---|
| #1 | Leroux Thierry | 11 |
| #2 | Boher Pierre | 7 |
| #3 | Luet Mathieu | 3 |
| Publication | Filing date | Title |
|---|---|---|
| EP1857836A1 | Device and method for discriminating cerenkov and scintillation radiation | |
| EP1657580A1 | Optical device for determining the in-focus position of a fourier optics set-up | |
| EP1640706A1 | Wavelength and incidence angle resolved ellipsometer or reflectometer | |
| EP1598647A1 | Interferometer and fourier transform spectrometer |