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EDDIO CORP

Overview
  • Total Patents
    35
About

EDDIO CORP has a total of 35 patent applications. Its first patent ever was published in 1974. It filed its patents most often in Japan and United States. Its main competitors in its focus markets measurement and machine tools are MO N PROIZV OB NEFTEGAZAVTOMAT, HELLMA GMBH & CO KG and NI PK T I ELMASH.

Patent filings in countries

World map showing EDDIO CORPs patent filings in countries
# Country Total Patents
#1 Japan 33
#2 United States 2

Patent filings per year

Chart showing EDDIO CORPs patent filings per year from 1900 to 2020

Focus industries

Top inventors

# Name Total Patents
#1 Hayashibe Shiyouji 9
#2 Hayashibe Shoji 6
#3 Saeki Akira 6
#4 Iida Fumio 5
#5 Hashimoto Kiyomi 5
#6 Kokubu Akio 4
#7 Yoshida Mitsuo 4
#8 Isobe Shinichi 3
#9 Yamazaki Makoto 3
#10 Kawakami Masanobu 3

Latest patents

Publication Filing date Title
JP2011002409A Leak flux flaw detecting device
JPH04115156A Method and apparatus for controlling terminal dead zone for electromagnetic induction flaw detection
JPH03115851A Coil apparatus for eddy current flaw detection
JPH02235537A Automatic scraping device
JPH02221857A Rotary head mechanism of rotary leakage magnetic flux flaw detecting machine
JPH02147950A Ac leakage magnetic flux detector for plane flaw
JPS646857A Automatic flaw detecting device
JPS63247082A Sealing apparatus for marking
JPS62237311A Automatic reflectivity correction type displacement gauge
JPS62172258A Leakage magnetic flux flaw detector
JPS62172259A Eddy current flaw detector
JPS6259856A Lengthwise flaw detecting device
JPS6131945A Optical flaw detecting device
JPS618656A Method and device for detecting flux filling state
JPS60247158A Hot flaw detection apparatus
JPS60202353A Multi-channel eddy current flaw detection apparatus
JPS60187858A Hot flaw detector
JPS58127116A Detecting device for angle of inclination
JPS58102150A Hot rotary flaw detector
JPS5855753A Flaw detecting device