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DUPONT TEIJIN FILMS US LTD

Overview
  • Total Patents
    409
  • GoodIP Patent Rank
    48,407
About

DUPONT TEIJIN FILMS US LTD has a total of 409 patent applications. Its first patent ever was published in 1992. It filed its patents most often in EPO (European Patent Office), WIPO (World Intellectual Property Organization) and United Kingdom. Its main competitors in its focus markets machines, surface technology and coating and macromolecular chemistry and polymers are MITSUBISHI POLYESTER FILM GMBH, HOECHST TRESPAPHAN GMBH and DUPONT TEIJIN FILMS US LTD PARTNERSHIP.

Patent filings per year

Chart showing DUPONT TEIJIN FILMS US LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Sankey Stephen William 48
#2 Deng Fenghua 34
#3 Mackerron Duncan Henry 30
#4 Franzyshen Stephen K 30
#5 Cosentino Steven R 28
#6 Macdonald William Alasdair 23
#7 Turner David 22
#8 Brennan William J 22
#9 Macdonald William A 21
#10 Colquhoun Howard 20

Latest patents

Publication Filing date Title
EP3091047A1 Polyester film with electrical insulation and heat conduction properties
GB201507547D0 Peelable adhesive polymeric film
GB201504291D0 PV cells
WO2015120018A1 Antistatic coated polyester film
GB201412153D0 Polyester film
GB201411044D0 Copolyestermides and films made therefrom
GB201409063D0 Coated polyester films
WO2014068329A1 Uv-stable polyester film
GB201317705D0 Copolyesters
GB201317551D0 Co-extruded polyester films
GB201310837D0 Polyester film -IV
GB201310147D0 Polyester film - llll
CN104159744A Heat sealable nylon film and method of making it
WO2013093446A1 Copolyesterimides of poly(alkylene terephthalate)s having high glass transition temperature and film made therefrom
CN103998485A Copolyesterimides of poly(alkylene naphthalate)s having high glass transition temperature and film made therefrom
GB201222836D0 Polyester and film -iia
KR20140102694A Metallized opaque films with robust metal layer attachment
GB201219779D0 Polyester film
GB201219780D0 Polyester film
GB201216722D0 An Interferometric Method for Profiling the Topography of a Sample Surface