| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 5 | |
| #2 | WIPO (World Intellectual Property Organization) | 4 | |
| #3 | EPO (European Patent Office) | 3 |
| # | Industry | |
|---|---|---|
| #1 | Electrical machinery and energy | |
| #2 | Audio-visual technology | |
| #3 | Measurement | |
| #4 | Semiconductors |
| # | Technology | |
|---|---|---|
| #1 | Electric discharge tubes | |
| #2 | Television | |
| #3 | Analysing materials | |
| #4 | Semiconductor devices |
| # | Name | Total Patents |
|---|---|---|
| #1 | Bilhorn Robert B | 5 |
| #2 | Jin Liang | 5 |
| #3 | Bammes Benjamin | 4 |
| #4 | Bilhorn Robert | 4 |
| #5 | Bammes Benjamin Eugene | 3 |
| #6 | Nguyen-Huu Xuong | 2 |
| #7 | Ellisman Mark | 2 |
| #8 | Ellisman Mark H | 1 |
| Publication | Filing date | Title |
|---|---|---|
| WO2020214985A1 | A system, apparatus, and method for determining elemental composition using 4d stem | |
| EP2962252A1 | Method of electron beam imaging of a specimen by combining images of an image sequence | |
| US2010237252A1 | Method of high-energy particle imaging by computing a difference between sampled pixel voltages | |
| US2010025579A1 | Apparatus and method including a direct bombardment detector and a secondary detector for use in electron microscopy |