| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 4 | |
| #2 | WIPO (World Intellectual Property Organization) | 3 | |
| #3 | EPO (European Patent Office) | 2 | |
| #4 | United Kingdom | 2 | |
| #5 | Brazil | 1 | |
| #6 | China | 1 | |
| #7 | Japan | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Machine tools |
| # | Technology | |
|---|---|---|
| #1 | Measuring length, angles and areas | |
| #2 | Rolling metal | |
| #3 | Analysing materials |
| # | Name | Total Patents |
|---|---|---|
| #1 | Gignoux Dominique | 6 |
| #2 | Patel Bipin | 4 |
| #3 | Gouel Roland Michel | 3 |
| #4 | Murray Russell | 2 |
| #5 | Gignoux Dominque | 1 |
| #6 | Gouel Roland | 1 |
| #7 | Dominiku Gikunotsukusu | 1 |
| #8 | Ratsuseru Mari | 1 |
| #9 | Gouel Roland M | 1 |
| Publication | Filing date | Title |
|---|---|---|
| US5388341A | Virtual two gauge profile system | |
| GB9113990D0 | Means of calibrating x-ray gauging systems | |
| GB9105639D0 | Dynamic alloy correction gauge | |
| US5113421A | Method and apparatus for measuring the thickness of a coating on a substrate | |
| US4574387A | Apparatus and method for measuring thickness |