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CREWT MED SYS INC

Overview
  • Total Patents
    47
  • GoodIP Patent Rank
    35,841
  • Filing trend
    ⇧ 200.0%
About

CREWT MED SYS INC has a total of 47 patent applications. It increased the IP activity by 200.0%. Its first patent ever was published in 2012. It filed its patents most often in Japan, WIPO (World Intellectual Property Organization) and United States. Its main competitors in its focus markets medical technology, optics and computer technology are NEURO KINETICS INC, SYSTEMS KK I and ASYMMETRIC MEDICAL LTD.

Patent filings in countries

World map showing CREWT MED SYS INCs patent filings in countries

Patent filings per year

Chart showing CREWT MED SYS INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Kimura Shinji 45
#2 Yamanaka Kenzo 43
#3 Inoue Satoshi 36
#4 Onaka Tsuyoshi 6
#5 Sudou Fumitaka 6
#6 Onaka Takeshi 5
#7 Suto Fumitaka 5
#8 Eguchi Tetsuya 4
#9 Sato Hiroki 3
#10 Matsumoto Chouta 2

Latest patents

Publication Filing date Title
JP2019162254A Visual field examination device, control method thereof, and visual field examination program
JP2019154464A Visual inspection apparatus and visual inspection program
JP2018175011A Head-mounted display support instrument and head-mounted display unit
JP2017192564A Vision testing apparatus, reliability evaluation method, reliability evaluation program, and reliability evaluation system
WO2016072272A1 Eyesight examination device, and head mounted-type display device
JP2017064301A Head-mounted display unit and head-mounted display fixture
JP2017042301A Eye examination device
EP3210524A1 Visual examination apparatus
WO2016063600A1 Vision examination device and head-mounted display device
JP2017018191A Standard eye module device and method for evaluating campimeter
JP2017000223A Vision testing apparatus
JP2017000224A Vision testing apparatus
JP2016198387A Visual inspection device, target correction method for visual inspection device, and display device
JP2016087173A Visual inspection apparatus and visual inspection method
JP2017225469A Visual examination apparatus
JP2017217016A Visual inspection device
JP2015006425A Visual inspection apparatus and visual inspection program
WO2015166550A1 Ophthalmologic observation system
WO2015166548A1 Vision examination device and vision examination program
WO2015166551A1 Ocular function measurement device