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CII

Overview
  • Total Patents
    641
About

CII has a total of 641 patent applications. Its first patent ever was published in 1962. It filed its patents most often in Japan, France and United Kingdom. Its main competitors in its focus markets computer technology, audio-visual technology and semiconductors are CII HONEYWELL BULL, SILENT SYSTEMS INC and SAMSUNG EELCTRONICS CO LTD.

Patent filings per year

Chart showing CIIs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Lazzari Jean-Pierre 22
#2 Brule Pierre 14
#3 Emelina Richard 13
#4 Jiyan Pieeru Razari 13
#5 Grac Yvan 12
#6 Palix Didier 12
#7 Hubert Maurice 11
#8 Goff Denis Le 9
#9 Cooreman Charles 8
#10 Fressineau Jean-Louis 7

Latest patents

Publication Filing date Title
IE843030L Automatic biological product analysis
LU85632A1 Method and device for automatically analyzing biological samples
JPS6052913A Highly integrated magnetic converter for writing informationinto magnetic medium
JPS59131238A Encoding detecting and correcting system for transmission error in binary message
JPS59121444A Process control block on computer system
JPS58196471A Limit inspection device and machine using said device
GB2087625A Magnetoresistant transducer
GB2089121A Integrated circuit interconnection network
JPS5727459A Tape position detector and position measuring device including same detector
US4422118A Integrated magnetic transducer
US4319355A Method of and apparatus for testing a memory matrix control character
US4247760A Method and circuit arrangement for generating and processing two separate pulse trains bearing information
GB2042477A Arrangement for diverting documents in a machine incorporating means to sort the documents
ES485033A1 Automatic document processing machine
ES8100163A1 Method and device for stamping
US4246473A Character reading system
US4354208A Magnetic recording medium and digital storage device including same
JPS5544495A Hopper for receiving document made of material like paper
JPS5538597A Powder for developing latent image and preparing same
JPS5518800A Method for testing logic device and logic device