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CHO YASUO

Overview
  • Total Patents
    25
About

CHO YASUO has a total of 25 patent applications. Its first patent ever was published in 1993. It filed its patents most often in Japan, EPO (European Patent Office) and United States. Its main competitors in its focus markets audio-visual technology, micro-structure and nano-technology and semiconductors are SILMAG SA, TERASTOR CORP and CHOU TSUTOMU.

Patent filings per year

Chart showing CHO YASUOs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Cho Yasuo 22
#2 Onoe Atsushi 21
#3 Watanabe Kazutoshi 1
#4 Yasutake Masatoshi 1
#5 Atsushi Cho Yasuo Onoe 1
#6 Onoe A 1

Latest patents

Publication Filing date Title
WO2005098846A1 Information reproducing device for ferroelectric recording medium
EP1672102A1 Ferroelectric thin-film production method, voltage-application etching apparatus, ferroelectric crystal thin-film substrate, and ferroelectric crystal wafer
US2008214113A1 Signal detecting method and apparatus and information reproducing apparatus and method
WO2004097822A1 Recording/reproduction head and recording/reproduction device
JP2004127489A Dielectric reproducing apparatus, dielectric recording device, and dielectric recording and reproducing apparatus
JP2005004890A Data recording/reproducing device using needle-like member, and data recording/reproducing method
JP2004178750A Dielectric recording and reproducing head and dielectric recording and reproducing apparatus
JP2004101440A Dielectric recording apparatus, dielectric reproducing apparatus, and dielectric recording and reproducing apparatus
JP2004014016A Dielectric recording reproducing head, dielectric recording medium unit and dielectric recording reproducing device
JP2003296979A System of extracting recording condition of dielectric recording medium, recording condition extracting method and information recorder
JP2003085969A Dielectric information device, tape-like medium recording and reproducing device, and disk-like medium recording and reproducing device
JP2002323431A Scanning nonlinear permittivity microscope for measuring higher order nonlinear permittivity
JPH06216701A Elastic convolver device