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AU1030002A
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Design analysis workstation for analyzing integrated circuits
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US2002046386A1
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Design analysis workstation for analyzing integrated circuits
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US6763140B1
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Method and apparatus for focusing a micro-imaging system onto a tilted or uneven sample to acquire images of the sample
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US6671424B1
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Predictive image caching algorithm
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US6549222B1
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Lock-step cursors for feature alignment
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US6768102B1
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Method and system for recalibration during micro-imaging to determine thermal drift
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PL331114A1
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Method of analysing an integrated circuit, method of visualising an integrated circuit and method of analysing at last a portion of integrated circuit
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