BRIGHTVIEW SYSTEMS LTD has a total of 13 patent applications. Its first patent ever was published in 2009. It filed its patents most often in WIPO (World Intellectual Property Organization), EPO (European Patent Office) and Israel. Its main competitors in its focus markets measurement, environmental technology and semiconductors are DAINICHI KIKAI KOGYO KK, NIPPON KOGYO KENSA KK and LIPPKE P.
# | Country | Total Patents | |
---|---|---|---|
#1 | WIPO (World Intellectual Property Organization) | 6 | |
#2 | EPO (European Patent Office) | 3 | |
#3 | Israel | 3 | |
#4 | Taiwan | 1 |
# | Industry | |
---|---|---|
#1 | Measurement | |
#2 | Environmental technology | |
#3 | Semiconductors | |
#4 | Control |
# | Name | Total Patents |
---|---|---|
#1 | Finarov Moshe | 6 |
#2 | Noy Noam | 3 |
#3 | Shoham Benjamin | 3 |
#4 | Scheiner David | 3 |
#5 | Persky Nathan | 2 |
#6 | Lipson Ariel | 2 |
#7 | Aspir Doron | 1 |
Publication | Filing date | Title |
---|---|---|
IL214466D0 | Measurement of thin film photovoltaic solar panels | |
IL210259D0 | A method and apparatus for thin film quality control | |
IL210258D0 | A method and system for photovoltaic cells production yield enhancement | |
WO2011024170A1 | A method and apparatus for thin film quality control in a batch manufacturing layout | |
WO2010106534A1 | Measurement of thin film photovoltaic solar panels | |
WO2010106533A2 | A method and apparatus for accurate determination of parameters of a stack of thin films | |
EP2386059A1 | A system and method for thin film quality assurance | |
WO2009122393A2 | A method and system for photovoltaic cell production yield enhancement |