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BEIJING SHENGTAOPING TEST ENG TECH RES INST

Overview
  • Total Patents
    25
  • GoodIP Patent Rank
    63,491
About

BEIJING SHENGTAOPING TEST ENG TECH RES INST has a total of 25 patent applications. Its first patent ever was published in 2014. It filed its patents most often in China. Its main competitors in its focus markets measurement and computer technology are INFRARROJO Y MICROELECTRONICA, BEIJING HUADA INFOSEC TECHNOLOGY LTD and SHENZHEN MICSIG INSTR CO LTD.

Patent filings in countries

World map showing BEIJING SHENGTAOPING TEST ENG TECH RES INSTs patent filings in countries
# Country Total Patents
#1 China 25

Patent filings per year

Chart showing BEIJING SHENGTAOPING TEST ENG TECH RES INSTs patent filings per year from 1900 to 2020

Focus industries

Top inventors

# Name Total Patents
#1 Wang Qunyong 25
#2 Chen Dongmei 22
#3 Yang Hui 14
#4 Chen Yu 10
#5 Xue Haihong 6
#6 Zhang Feng 3
#7 Yan Panfeng 3
#8 Li Zhigang 3
#9 Bai Hua 2
#10 Zhong Zhengyu 1

Latest patents

Publication Filing date Title
CN105445589A Temperature testing box used for high-reliability electronic element
CN105718367A Method and system for automatically evaluating quality of IP core
CN105718714A Method and system for determining atmospheric neutron single-particle upset rate of microcircuit
CN105738922A Service reliability analysis method and system of navigation satellite constellation system
CN105740596A Method and system for analyzing atmospheric neutron single event effect of aviation electronic system
CN105718713A Reliability analysis method of space radiation environment
CN105718622A Method and system for predicting single-particle fault rate by single-particle upset rate
CN105717385A Method for detecting capability of resisting NSEE by avionic device
CN105717384A Component sensitive parameter degeneration measurement method
CN105676103A Method and device for acquiring sensitive section of atmospheric neutron single event effect sensitive device
CN105676102A Method and device for acquiring sensitive section of neutron single event effect device based on FOM
CN105676017A Method and device for acquiring sensitive section of single event effect device based on test data
CN105676016A Method and device for acquiring sensitive section of neutron single event effect device based on BGR
CN105679371A DRAM neutron single event effect test control method and apparatus
CN105679370A SRAM neutron single event effect test control method and apparatus
CN105676720A CPU neutron single event effect test control method and device
CN105609139A Control method and device of SRAM (Static Random Access Memory) type FPGA (Field Programmable Gate Array) neutron single event effect test
CN105590651A DRAM (dynamic random access memory) neutron single event effect test method
CN105590653A Neutron single event effect testing method of a SRAM type FPGA
CN105589780A Neutron single event effect testing method of CPU