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BEIJING INST OF AUTO TESTING TECHNOLOGY

Overview
  • Total Patents
    15
  • GoodIP Patent Rank
    219,849
About

BEIJING INST OF AUTO TESTING TECHNOLOGY has a total of 15 patent applications. Its first patent ever was published in 2010. It filed its patents most often in China. Its main competitors in its focus markets electrical machinery and energy and environmental technology are KIM BO HYUN, HUSSEY CHARLES A and JIANGSU INGENIOUS ENE-CARBON ENERGY TECH CO LTD.

Patent filings in countries

World map showing BEIJING INST OF AUTO TESTING TECHNOLOGYs patent filings in countries
# Country Total Patents
#1 China 15

Patent filings per year

Chart showing BEIJING INST OF AUTO TESTING TECHNOLOGYs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Zhang Dong 10
#2 Yu Ming 8
#3 Li Jie 6
#4 Gao Jian 5
#5 Jiang Yanfeng 5
#6 Jiang Changbin 4
#7 Zhao Xuelian 3
#8 Ju Jiaxin 2
#9 Liu Chunlai 2
#10 Wang Xin 2

Latest patents

Publication Filing date Title
CN104596719A Quick evaluation method for ultimate stress strength of integrated circuit for spaceflight
CN104597389A Quick evaluation method for plastic encapsulated integrated circuit reliability under marine environment condition
CN103678075A Complex microprocessor test method based on automatic vector generation technology
CN103682485A Non-contact distributed control system for power battery pack
CN103682224A Flexible chip, power battery pack with same and electric automobile
CN104635067A Radio frequency signal testing method
CN103052246A Electronic ballast with controllable power
CN103064013A Integrated circuit testing method based on fault models
CN103809053A Intelligent detection method for circuit board
CN102522894A Voltage conversion circuit for power device test system
CN102522725A Intelligent overcurrent protection circuit for integrated circuit test system
CN102158690A Remote multichannel real-time video monitoring system
CN102075748A Search method for video coding motion estimation
CN102097328A Method for manufacturing high-power field effect transistor
CN102466776A Batch testing method for complex programmable logic device